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TROUBLESHOOTING
9526ARo
Technical Documentation
NHC–4
6–2–1
Copyright
©
Nokia Mobile Phones
Contents
Troubleshooting for Base Band
Overview to base band troubleshooting
General
Current consumption failures in flash station
Phone takes all available current
Phone does not take current at all
Current consumption OK during power–up, then fail
Troubleshooting Diagram; Flash Programming OK, part 1
Troubleshooting Diagram; Flash Programming OK, part 2
Troubleshooting Diagram; Flash Programming OK, part 3
Troubleshooting Diagram; Flash Programming OK, part 4
Troubleshooting Diagram; PWR Button Fault
Troubleshooting Diagram; Display Selftest Failed
Troubleshooting Diagram; Audio Fault
Power Up Sequency Diagram
Repairing Instructions for Flash Faulty Units
Calib BATT_VOLTAGE = 6.0 V
Calib CHARGE_VOLTAGE = 6.0 V
Troubleshooting Diagram; Power Up and MCU Selftest Malfunctions
Power Up Malfunction
Troubleshooting Diagram; Power Up Malfunction
Troubleshooting Diagram; MCU Selftests Malfunction
Troubleshooting for RF
The Red Line of this Repair Guide
Alignment Stage References
Final Stage References
How to read those sheets?
ERROR A10; The DUT does not turn on
ERROR A13a; AFC tuning fails
ERROR A13b; UHF Synthesizer
ERROR A13c; VHF Synthesizer
ERROR A20; Fail in Bias Control tuning
ERROR A22–57a; Fail in power level table
ERROR A22–57b; Fail in power level table, part II
ERROR A22–57c; Fail in power level..., part III
ERROR A22–57d; Fail in power level..., part IV
ERROR A66; RX audio gain tuning fail
ERROR A67; SINAD – fail
ERROR A68; RSSI – level fail
6–2–3
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6–2–42
6–2–44
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TROUBLESHOOTING
9526ARo
Technical Documentation
NHC–4
6–2–2
Copyright
©
Nokia Mobile Phones
ERROR A69–70; Tuning ST/audio deviation
ERROR A72; The I/Q Tuning fails
ERROR A73; Digital AGC tuning fails
ERROR A00; RF side supply voltages
6–2–48
6–2–49
6–2–51
6–2–53
TROUBLESHOOTING
9526ARo
Technical Documentation
NHC–4
6–2–3
Copyright
©
Nokia Mobile Phones
Troubleshooting for Base Band
Overview to base band troubleshooting
The purpose is to define fault block of the module and then find out the defect
component.
Baseband oriented failures are usually found out in the flash station of the pro-
duction line.In the first phase,before programming the flash,the phone is started
to minimum mode and current consumption is measured.If current consumption
is in acceptable limits and MBUS registration is OK,flash is programmed.After
flash programming phone is started to local mode and tester starts to send
MBUS messages to activate MCU self tests.During the MCU self tests all the
major components of the baseband are tested.Every test returns number of the
test and result ( OK / failed ).All information of the test is stored to phone ori-
ented test file,witch is available on the troubleshooting station.MCU self tests
can be restarted on trobleshooting station with SERVICE PCLOCALS.
If phone can be flashed and all/some self tests performed,the baseband is
mainly OK.By refering the test file of the phone,defect component or connec-
tions between components can located.
In case of current consumption/MBUS registration failure,the phone must be
taken to more specific measurements of voltages,clocking signals and states of
reset signals.
TROUBLESHOOTING
9526ARo
Technical Documentation
NHC–4
6–2–4
Copyright
©
Nokia Mobile Phones
General
The purpose is to define fault block of the module and then find out the broken com-
ponent. The trouble shooting diagram has been planned so that the fault, whatever
it is, can be found by as simple measurements as possible.
The flow diagrams give you the overview of the blocks. The purpose is that you
proceed through the flow diagram so that, if your answer is YES for the asked
question, go straight to the next level, but if your answer is NO, you have to go
the subbranch.
Required servicing equipment:
– PC for PC locals
– Power supply (2.0 A)
– Digital multimeter
– Oscilloscope
– Modular cable
– RS232/MBUS adapter
TROUBLESHOOTING
9526ARo
Technical Documentation
NHC–4
6–2–5
Copyright
©
Nokia Mobile Phones
Current consumption failures in flash station
Current consumption can fail in three ways in flash station.Typical to all these
failures is,that phone can not be programmed or tested via MBUS.The most
common failure is that phone takes almost normal current during startup and
after couple of seconds all circuits are powered down.Reason for this failure is
in power–,clock– or reset distripution of the phone.In cases where phone does
not take current at all or phone takes all available current the reason is usually
defected power ASIC PSL+ (N100) or bad soldering ( short or open ) around
PSL+ .
Phone takes all available current
If phone takes all available current,the reason for failure can be detected by:
– visual check of bad solderings in PSL+ (N100) , components around it and
bottom connector X1
– cheking ,if transistors V908,V910 and V911 in TX block are defected
Phone does not take current at all
If phone does not take current at all,check following things:
– solderingins of PSL+
– VBATT voltage should be available in pins 5 and 20 of PSL+
If connections of PSL+ are OK and VBATT in pins 5/20 is OK, change defected
power ASIC N100
Current consumption OK during power–up, then fail
The most common situation in current consomption failures is,that phone starts
almost normally,but after few seconds all circuits are powered down.The pow-
er–down is normally caused by lack of watch–dog signal from MCU to
PSL+.There are three major things to be checked in this kind of failure situa-
tion.First,check power distribution to all main components of baseband.Then
check that clock is delivered to ASIC,DSP,MCU,RFI and AUDIO CODEC.If ev-
erything is OK so far,check RESET status of circuitry mentioned above.
Cheking the power distribution of baseband
Before voltage measurements of the circuitry,power–down of PSL+ must be
prevented.This is done by shorting the watch–dog timing capacitor C106 with
wire soldered from one end of the cap to the other.
1.Check PSL+ output voltages from N100 pins 4,21,2,24 and 1.Expected value
is around 4.65V.Also,check voltage in N100 pin 12 (DETIN) to be 1.23V
2.Check supply voltage VL1 (4.65V) of MCU (D302) from pins 5 and 42.Check
VREF voltage from MCU pin 60.Check voltages of MCU related memory cir-

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